R1EX24064ASAS0A#S0

Product Overview

The R1EX24064ASAS0A#S0 is an EEPROM memory integrated circuit from Renesas Electronics Corporation. It provides 64Kbit of non-volatile storage organized as 8K x 8 and communicates through an I2C interface with a 400 kHz clock specification. The device is supplied in a surface-mount 8-SOP package, with package/case data listed as 8-SOIC, 3.90 mm width, and operates from a 1.8 V to 5.5 V supply. Its specified access time is 900 ns, and its write cycle time for word or page operations is 5 ms. The part is rated for an ambient operating temperature range of -40°C to 85°C and is listed as Obsolete.

Key Features

• 64Kbit EEPROM memory organized as 8K x 8 for non-volatile data storage.
• I2C memory interface with a 400 kHz clock specification.
• 1.8 V to 5.5 V supply voltage range.
• 900 ns access time and 5 ms word/page write cycle time.
• Surface-mount 8-SOP package with an 8-SOIC 3.90 mm width body.
• Operating temperature range of -40°C to 85°C ambient.

Applications

• Storage of configuration parameters in microcontroller-based embedded systems.
• Retention of calibration constants and setup data in board-level electronics.
• Non-volatile recording of user settings or device profiles in electronically controlled products.
• Storage of module identification or initialization data for serially accessed peripherals.

Design & Procurement Notes

When evaluating the R1EX24064ASAS0A#S0, confirm that the 8K x 8 organization, I2C clock rate, and 5 ms write cycle fit the host controller timing and firmware update flow. The 900 ns access time should be considered when defining read timing. The 1.8 V to 5.5 V supply range should be checked against the system rail used during normal operation and write operations. For PCB layout, use the supplied 8-SOIC, 3.90 mm width surface-mount package dimensions rather than assuming a generic SOP footprint. The Obsolete product status should be reviewed for lifecycle-sensitive designs, and the -40°C to 85°C ambient range should be compared with the expected environmental conditions.